Organised by the Institute of Physics's Electron Microscopy and Analysis Group (EMAG), the 2019 EMAG Conference will be part of mmc2019.

mmc2019 EMAG Keywords

- Detector Technologies and New Instrumentation
- Phase Sensitive Techniques
- Spectroscopy
- Automated Control, Advanced Data Processing and Modelling Techniques
- 3-D and Correlative Microscopy
- In situ Microscopy Techniques
- Dynamic EM
- Low Dose/Low Voltage Imaging and Analytical Microscopy
- Advances in SEM and FIB (CL, EBSD, Beam Deceleration, Monochromators, Ion Sources, STEM etc)
- Electron Crystallography and Diffraction

- Biological Materials, Biomaterials and Soft Matter and Polymers
- Geological Microscopy
- Catalytic Materials
- Nanomaterials and 2D Materials
- Energy and Energy Storage Materials
- Functional Semiconductor and Oxide Materials
- Structural Materials and Metallurgy
- Surface Imaging and Modification
- Microscopy of Interfaces and Heterostructures
- High Resolution Chemical and Structural Analysis

For more information on our Invited Speakers please click on their name.

EMAG Invited Speakers
  • Dr Caterina Ducati (University of Cambridge, UK) - Nanomaterials
  • Professor Randi Holmestad (NTNU, Norway) – Metallurgy
    • Talk Title: Precipitates in aluminium alloys – studied by advanced (S)TEM techniques

      Randi Holmestad Randi Holmestad (born in 1967) is (since 99) a professor at Department of Physics, Norwegian University of Science and Technology, NTNU in Trondheim, Norway.   She has a PhD (Dr. ing.) in materials physics from NTH in Trondheim in 1994 and a MSc (Siv. Ing.) in physics, from the same university in 1991. Holmestad’s present research interests are focussed on materials physics; transmission electron diffraction, microscopy and spectroscopy (TEM, HREM, EDS, EELS, STEM), materials microstructure and the relation to macroscopic properties, modelling and simulations in materials physics, in particularly used on aluminium alloys. Ongoing projects are on aluminium alloys, solar cell materials, electron diffraction and new functional materials. She has educated 14 PhD students and 60 MSc students, she has at present 6 PhD students. Holmestad has had several sabbaticals abroad, latest 6 months in 2005 and 2012, both at University of Illinois, Urbana-Champaign, IL, USA. Web of Science (Nov 2018): Cited documents = 202, Citations = 2500, h-index = 27.

  • Professor Raynald Gauvin (McGill University, Canada) – SEM microanalysis
    • Talk title: Analytical STEM at 30 keV; EDS, EELS and CBED

      Raynald Gauvin Professor Raynald Gauvin received his Ph.D. in 1990 at École Polytechnique de Montréal in Metallurgical Engineering. He was then appointed as an assistant professor in Mechanical Engineering at Université de Sherbrooke where he became associate Professor in 1995 and full Professor in 1998. In 2001, he joined the department of Mining and Materials Engineering of McGill University, Montréal, Canada, as a full Professor. Pr. Gauvin’s research interest are related in developing new methods to characterize the microstructure of materials using high resolution scanning electron microscopy with x-ray microanalysis and Monte Carlo simulations. He is the creator of the CASINO program that is used by more than 10 000 users in the world. He has more than 300 papers in scientific journals and conference proceedings. He was Invited Speaker in more than 100 international scientific conferences. He won several scientific prices, most notably the 31st Canadian Materials Physics Medal in 2007 by the Metallurgical Society of the Canadian Institute of Mining, the Heinrich Award in 1997 from the Microbeam Analysis Society of America and the Prix d'excellence du président de l’École for the best Doctorate Thesis defended in 1990 at École Polytechnique de Montréal. Pr. Gauvin was the President of the Inter American Societies of Electron Microscopy (CIASEM) from 2009 to 2011, the President of the Microbeam Analysis Society of America (MAS) from 2005 to 2006, the President of the Microscopical Society of Canada (SMC) from 2001 to 2003 and the President of the International Union of the Microbeam Analysis Societies (IUMAS) from 2000 to 2005. He is currently the holder of the Birks Chair in Metallurgy. He was appointed in 2017 Honorary Member of the European Microbeam Analysis Society (EMAS).

  • Dr Florent Houdellier (CEMES-CNRS, France) – DTEM/pulsed sources
  • Dr Mathieu Kociak (Universite Paris Sud, France) – STEM CL/EELS plasmons
    • Talk title: Ultra-high resolution STEM-EELS and cathodoluminescence

      Mathieu Kociak Mathieu Kociak is researcher at the Centre National de la Recherche Scientifique (CNRS), with a research director position in the STEM group at the Laboratory for Solid States Physics (LPS) in Orsay, France. His main research interests include the study of the correlations between the structure, and the optical and electronic properties of individual nanoobjects, that he tackles through a combination of instrumental developments in electron microscopy, experiments on the STEM and theory of the electron/matter/photon interaction. He is currently working especially on nanooptics with fast electrons using EELS and nanocathodoluminescence (STEM-CL). He has transferred his STEM-CL technology to the Attolight compagny. He is the scientific leader of CHROMATEM, a ultra-high energy resolution electron microscopy project, and the director of the french electron microscopy network METSA. Mathieu's awards include the Guinier Prize of the french Physical Society (2002), the quadrennial FEI-EM award (2012) of the European Microscopy Society, the Innovation Prize of the university Paris-Sud (2014) and the Agar Medal of the Royal Society of Microscopy (2015).

  • Dr Carol Trager-Cowan (University of Strathclyde, UK) – EBSD
    • Talk title: Electron backscatter Diffraction - Exploring the Structural Properties of Materials in the Scanning Electron Microscope

      Carol Trager-Cowan Carol Trager-Cowan is a Reader in the Department of Physics in the University of Strathclyde. Together with her research team and with collaborators from across the world, she works on new developments and novel applications of the scanning electron microscopy techniques of electron backscatter diffraction, electron channelling contrast imaging and cathodoluminescence imaging. In particular, she and her team combine these techniques to, rapidly and non-destructively, analyse defects and their effect on light emission from nitride semiconductors.


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