Organised by the Institute of Physics's Electron Microscopy and Analysis Group (EMAG), the 2023 EMAG Conference will be incorporated into mmc2023.
University of Leeds, UK
Talk title: Moving to STEM of Soft Matter
Andy is a Professor in the School of Chemical and Process Engineering at the University of Leeds and is currently the RMS Honorary Secretary, Physical Sciences. Andy has a background in the application of analytical transmission electron microscopy to the characterization of materials, focusing more recently on nanoparticles and beam sensitive materials.
University of Liverpool, UK
Talk title: Dictionary Learning Methods for Low Dose and High Speed Imaging in Electron Microscopy
Professor Nigel Browning is currently the Chair in Electron Microscopy and Director of the Albert Crewe Centre for Electron Microscopy at the University of Liverpool (since 2017). He has previously held positions at Oak Ridge National Laboratory (1992-1995), Lawrence Berkeley National Laboratory (2003-2006), Lawrence Livermore National Laboratory (2006-2011) and most recently was a Laboratory Fellow and Lead for the Chemical Imaging Initiative (CII) at the Pacific Northwest National Laboratory (PNNL) (2011-2017). He was also Assistant/Associate Professor of Physics at the University of Illinois at Chicago (1996-2002) and Professor of Materials Science (2003-2011) and Molecular Biology (2009-2011) at the University of California-Davis. He is a Fellow of the American Association for the Advancement of Science (AAAS) and the Microscopy Society of America (MSA). He received the Burton Award from the MSA in 2002 and the Coble Award from the American Ceramic Society in 2003 for the development of atomic resolution methods in scanning transmission electron microscopy (STEM). With his collaborators at LLNL he also received R&D 100 and Nano 50 Awards in 2008, and a Microscopy Today Innovation Award in 2010 for the development of the dynamic transmission electron microscope (DTEM). He has over 400 refereed publications (~29,000 citations, h-index=91) and has given over 380 invited presentations on advanced STEM/TEM methods. For the past four years, he has also been a Co-founder and Vice-President for Research Strategy at Nuxutra, a start-up company commercializing IP he co-developed on Inpainting for electron microscopy (>15 patents on compressive sensing / machine learning for imaging).
Oak Ridge National Laboratory, USA
Talk title: Elucidating local charge redistributions in energy and quantum materials using 4D-STEM
Miaofang Chi is a Distinguished Scientist at the Center for Nanophase Materials Sciences (CNMS) at Oak Ridge National Laboratory (ORNL). She serves as the committee chair of Educational Resources for Microscopy Society of America (MSA) and on the editorial board of Materials Today. Her primary research interests are in understanding interfacial charge transfer and ion transport behavior in energy and quantum materials by advancing and employing novel electron microscopy techniques.
School of Physics and Astronomy, University of Glasgow, UK
Talk title: Quantitative EELS: Instrumentation, Techniques and Applications
Alan Craven started his research career as a PhD student of Archie Howie in the Cavendish Laboratory, where he built a UHV field emission scanning electron microscope for surface studies. He then became the PDRA in charge of the first VG HB5 in the Cavendish before taking up a Lectureship at Glasgow University. He subsequently became Senior Lecturer, Reader and Professor. Latterly led the Solid State Physics Research Group before retiring in 2012. He is now Professor Emeritus and Senior Honorary Research Fellow there. During his career, he was Secretary and Chair of the EMAG Committee, Secretary of BJCEM, a member of RMS Council, a member of the Executive Council of IFSM and a member of the SuperSTEM Management Committee. He was recently made an Honorary Fellow of the Royal Microscopical Society.
Throughout his career, his research focused on developing instrumentation and techniques for STEM-EELS and applying them to a wide range of materials systems. In recent years, he has worked on measuring experimental EELS cross-sections and using them to analyse precipitates within the steel matrix. Part of this programme involved improvements to the coupling of the EELS signal into the spectrometer and the correction of spectral data for artifacts introduced by the spectrometer itself.
CNRS, LRCS lab & RS2E network, France
Talk title: In situ liquid TEM to study the lithiation dynamics in battery materials
After obtaining his PhD thesis on nanomaterials and electron microscopy at the Sorbonne University in Paris, he worked for 5 years on energy materials and in situ experiments at the Argonne National Laboratory in Chicago. Since 2015, he is a CNRS researcher in the LRCS laboratory in Amiens (France). He studies the dynamics of lithiation in Li-ion battery materials in multi-scale and multimodal modes based on the development of in situ/operando methods via TEM and X-ray tomography techniques. His research is today strongly involved in the use and development of machine/deep learning tools for image processing and data analysis. He is also responsible for the electron microscopy/X-ray platform of the RS2E French battery network.
University of Manchester, UK
Talk title: Applications of the new fs-laser capability in tri-beam for large volume microscopy
Dr Ali Gholinia is a Research Fellow working in the Department of Materials at the University of Manchester, United Kingdom. He obtained his PhD from Materials Science Centre at the University of Manchester. After post-doctoral positions at the University of Manchester in United Kingdom and TU-Delft in the Netherlands, he worked at HKL and Oxford Instruments in Denmark on development of electron backscatter diffraction (EBSD) technique and its applications, before taking up his current position in Manchester.
His expertise includes materials characterisation and processing. He has been working in the field of electron microscopy for over 20 years. His materials characterisation expertise includes microstructure and phase analysis using scanning electron microscopy (SEM), focused ion beam (FIB) and electron backscatter diffraction (EBSD). His research focus is on 3D correlative and multi-modal microstructure characterisation of materials between X-ray computed tomography and serial sectioning techniques in SEM. Furthermore, he is interested in linking materials microstructure and mechanical properties using in-situ tensile deformation in SEM.
Department of Materials, University of Oxford, UK
Talk title: Phonon vibrations probed using the electron microscope
Rebecca is an Associate Professor and EPSRC Research Fellow in the Department of Materials at Oxford University. Her work focuses on the structure and bonding of materials at the atomic scale and bridges the gap between experiment and theory. She is one of the authors of the OptaDOS code and has worked on a variety of materials from doped graphene to zirconia. Rebecca’s current research interests include predicting the vibrational spectra that can now be measured with the electron microscope and understanding defects in rare earth superconductors.
University of Cambridge, UK
Talk title: Understanding mesoporous nitiride semiconductors using electron microscopy
Professor Rachel Oliver FREng received her MEng and PhD degrees from the University of Oxford. She then moved to Cambridge as a Research Fellow at Peterhouse, and later won a Royal Society University Research Fellowship. In 2011, she took up her permanent academic position at the University of Cambridge and she is currently Professor of Materials Science and Director of the Cambridge Centre for Gallium Nitride. In January 2023, she became a Royal Academy of Engineering Chair in Emerging Technologies.
Rachel’s research focusses on understanding how the small scale structure of nitride materials effects the performance and properties of devices. She uses expertise in microscopy and materials growth to develop new nanoscale nitride structures which will provide new functionality to the devices of the future. She is also a spinout founder, and a passionate advocate for increased equality, diversity and inclusion in science and engineering.
Chalmers University of Technology, Sweden
Talk title: Exploring strain effects of optoelectronic properties of semiconductor nanostructures by in situ electron microscopy
Eva Olsson is a full Professor of Experimental Physics and is currently the Head of the Division of Nano and biophysics at the Department of Physics, Chalmers University of Technology. She is mainly interested in materials for emerging technologies, including catalysis, photovoltaic and quantum devices and her research group focuses on the development of novel characterisation techniques for these materials. Professor Olsson works with electron microscopy including in situ studies and quantitative imaging and spectroscopy. She has been the President of the Nordic Microscopy Society (Scandem) and is presently the Secretary General of the International Federation of Microscopy Societies (IFSM).
Electron Microscopy Center, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland
Talk title: Probing Improper Ferroelectrics by In Situ TEM
Marta D. Rossell received her doctoral degree from the University of Antwerp (Belgium) in 2006. Thereafter, she carried out postdoctoral studies at the National Center for Electron Microscopy (NCEM) of the Lawrence Berkeley National Laboratory, at the University of California at Berkeley, and at the Swiss Federal Institute of Technology Zurich (ETH Zurich). Marta D. Rossell is since 2011 staff scientist of the Electron Microscopy Center of the Swiss Federal Laboratories for Materials Science and Technology (Empa).
Marta’s research interests center on understanding the atomic-level structure-property relationship of innovative functional materials by employing various transmission electron microscopy techniques, such as ultra-high spatial resolution, low-voltage electron microscopy, and electron energy-loss spectroscopy. Her current research focusses in in-situ heating/biasing electron microscopy of ferroelectric/magnetoelectric oxides.