A Fast Simulation Framework for Damage Diffusion Distribution in Scanning Transmission Electron Microscopy
Authors
Amirafshar Moshtaghpour (1), Amir Javadi Rad (2), Ali Mostaed (1), Dongdong Chen (2), Angus Kirkland (1, 3)
Affiliations
- Rosalind Franklin Institute
- Heriot-Watt University
- University of Oxford
The abstract content is not included at the request of the author.
References
[1] K. Nordlund et al., Journal of Nuclear Materials, 512 (2018), p. 450-479.
[2] R. Egerton et al., Micron, 35 (2004), p. 399-409.
[3] R. Egerton, Micron, 119 (2019), pp. 72–87.
[4] K. Siangchaew and M. Libera, Philosophical Magazine A, 80 (1999), pp. 1001–1016.
[5] D. Jannis et al., Ultramicroscopy, 240 (2022), p. 113568.
[6] D. Nicholls et al., Nanoscale, 12 (2020), pp. 21 248–21 254.
[7] A. Moshtaghpour et al., Journal of Microscopy, 297 (2025), pp. 57–77.
[8] A. Moshtaghpour, A. Mostaed and A. I. Kirkland acknowledge the support of the RFI, funded by the UKRI, EPSRC. A. I. Kirkland is also funded by the University of Oxford. Amir Javadi Rad is funded by the James Watt Scholarship, Heriot-Watt University. Dongdong Chen is funded by the Heriot-Watt University.
Keywords
Scanning Transmission Electron Microscopy, Radiation Damage, Simulation, Smart Scans