mmc2021 Abstract Database

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Observing Changes in Polar Domain Structures in Ferroelectric Oxide Thin Films Using Atomic Resolution In-Situ Electron Microscopy

James Gott, Dorin Rusu, Jonathan Peters, Marin Alexe, Ana Sanchez
On the Dependence of the Sensitivity of EELS vs XEDS in the AEM with Thickness and Beam Energy

Andrew B. Yankovich, Lunjie Zeng, Eva Olsson, Nestor J. Zaluzec
Optimal experiment design for characterising structures containing multiple types of elements using 4D scanning transmission electron microscopy

Duygu Gizem Sentürk, Annick De Backer, Sandra Van Aert