Local Mapping of Thermoelectric Properties of 2D Structures via Scanning Thermal Gate Microscopy
- Abstract number
- 248
- Presentation Form
- Submitted Talk
- DOI
- 10.22443/rms.mmc2021.248
- Corresponding Email
- [email protected]
- Session
- Stream 4 (AFM): Functional Scanning Probe Microscopy for Advanced Material Science
- Authors
- Dr Achim Harzheim (3), Dr Charalambos Evangeli (3), Prof Oleg Kolosov (1), Prof Pascal Gehring (2)
- Affiliations
-
1. Lancaster University
2. UCLouvain
3. University of Oxford
- Abstract text
Studying local variations in the Peltier [1] or Seebeck coefficient of materials is important to optimise their thermoelectric properties and to enable applications like single-material thermocouples [2]. Yet most global experiments overlook spatial divergences in the signal and the role of local variation and the internal structure. Here, we developed Scanning Thermal Gate Microscopy (STGM), a non-invasive method to obtain high-resolution 2-dimensional maps of the thermovoltage [3]. We investigate junctions formed between single- and bi-layer graphene, identify the impact of internal strain and reduction of channel width on the local Seebeck. These findings and the newly developed STGM method will help to further understand and improve the thermoelectric properties of 2D devices.
- References
[1] Harzheim et al. Nano Letters, 18, 7719-7725 (2018).
[2] Harzheim et al. Advanced Functional Materials 30, 2000574(2020).
[3] Harzheim et al. 2D Materials 7, 041004 (2020).