Backscattered Electron and X-ray (BEX) imaging is a new technique for Scanning Electron Microscopy (SEM) which acquires data simultaneously from both Backscattered Electron (BSE) sensors and X-ray sensors, such as silicon drift detector. This results in high-resolution, colour images which contain topographic, crystallographic, and compositional information; acquired with the low dwell times of an imaging system and whilst operating at ‘standard’ SEM imaging conditions.
Join Evident at MMC in Manchester on 4-6th July to get an exclusive demonstration of the latest cutting-edge research solutions on booth 105. Discover a host of solutions including a fast and simple way for anyone to acquire expert-quality microscope images, blur-free whole-slide scanning of thick cleared samples and a sophisticated light sheet microscope designed specifically for core imaging facilities. Get a sneak peek of what will be on offer in this short preview, plus the opportunity to secure your personal demonstration with our dedicated specialists.