True Aberration-Free Image Shift on JEOL CryoARM 200 and CryoARM 300
- Abstract number
- 505
- Corresponding Email
- [email protected]
- Session
- Cryo-Electron Microscopy
- Authors
- Dr. Bartosz Marzec (1)
- Affiliations
-
1. JEOL (EUROPE) SAS
- Keywords
CryoEM, Cryo, TEM, Electron Microscopy, Abberation-Free
- Abstract text
This talk will focus on showing how different coma and astigmatism correction models extend the range available for image shift and improve data resolution.
