mmc2023 incorporating EMAG 2023 Abstract Database
View by session
-
A comprehensive serial block-face scanning electron microscopy solution with exchangeable acquisition system and data processing tools
-
A correlative super-resolution protocol to map the origins of endoplasmic reticulum calcium release events in dorsal root ganglion neurones
-
A cryo electron microscopy facility for materials research
-
Ac kelvin probe force microscopy enables nanoscale surface charge mapping in water
-
Activation of human CENP-E determined by cell Förster resonance energy transfer and optical tweezers.
-
Adaptability with Accessibility, The Microscopy Innovation Centre at King's College London
-
Advanced Cryogenic Focussed Ion Beam Sample Preparation: Beyond Electron Microscopy
-
Alignment and appraisal of a JEOL 2100Plus TEM at voltages down to 20kV
-
An investigation of plasmon dispersion in topological insulator Bi2Se3 using momentum-resolved electron energy loss spectroscopy.
-
Analysis of pharmaceutical materials using secondary electron hyperspectral imaging
-
Analysis of three-dimensional cellular scaffolds using multimodal imaging
-
Atomic force microscopy nano-characterization of bee-derived extracellular vesicles
-
Atomic Force Microscopy of a wheat fungal pathogen.
-
Atomic Resolution Imaging of Graphene-Encapsulated In2Se3 Monolayers
-
Atomic-Scale Characterisation of Structured Water Molecules at the Interface of Lipid Membranes
-
Characterisation of severely deformed Tribolayer by using high-resolution TEM coupled with Precession Electron Diffraction
-
Characterising interaction between DNA and autophagy receptor NDP52 through the automated analysis of AFM images
-
Characterization of metal oxide nanoparticles synthesized in encapsulins from Myxococcus xanthus
-
Characterizing Ferroelectric Materials with Advanced PFM Methods
-
Chemical mapping of organic and bio materials with 10 nm spatial resolution using scattering-type scanning near-field optical microscopy (s-SNOM)
-
Combined EDS mapping and ADF-STEM tomography for interface characterisation in glass composites
-
Combining machine learning with interferometric structured illumination microscopy for the imaging of dynamic process in three-dimensions.
-
Correlation of nanoscale electromechanical and mechanical properties of twisted double bi-layer graphene via UFM, PFM, and E-HFM
-
Correlative FLIM/Raman using the Renishaw inViaTM Raman microscope
-
Correlative light and electron microscopy (CLEM) analysis of the tumour microenvironment in non-melanoma skin cancer