mmc2023 incorporating EMAG 2023 Abstract Database

• A Novel Method for Minimising Contaminations for Sample Preparation Using FIB

  Ms Xiangli Zhong, Mr Kerui Wei, Prof Ping Xiao, Prof Sarah Haigh, Prof Philip J Withers

• Bits, Bandwidth, and Beam Placement Accuracy: A Primer for the Discerning FIB/SEM User

  Mr. Michael Phaneuf, Dr. Ken Lagarec

• Cryogenic large volume 3D characterization and damage free TEM sample preparation of beam sensitive materials using advanced multiple ion source PFIB integrated with dedicated flexible cryo stage

  Dr Min Wu, Dr Letian Li, Dr Haifeng Gao

• Innovative in-situ battery surface prep using FIB and GIS for AFM-in-SEM analyses

  Veronika Hegrová, Radek Dao, Vojtech Schanilec, Dr. Jan Neuman

• The role of plasma FIB-SEM in the preparation of samples for in-situ heat treatment of Al-Mn-Cr-Zr based alloys for additive manufacturing in the synchrotron

  Vendulka Bertschova, Bharat Mehta, Isac Lazar, Lars Nyborg, Anders Mikkelsen, Martin Slama

• The ultrastructure of bone in 3D: A twist of twists

  Daniel Buss, Roland Kroeger, Marc McKee, Natalie Reznikov

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