mmc2023 incorporating EMAG 2023 Abstract Database

• A study on the anomalous effects of strain in selected area diffraction patterns (SADP) due to boron doping in silicon

  Miss Kaviyadharshini Dhamotharan, Dr Budhika Mendis

• Automated precession assisted 4D-STEM for semiconductor analysis

  Dr. Rob Hooley, Dr. Tomáš Morávek, Ing. Jan Sopoušek, Dr. Jing Lu, Dr. Raman Narayan, Dr. JK Weiss, Dr. Narendraraj Chandran

• Evaluation of the impact of applying growth interruption stages in the growth of ultrathin GaAsSb layers.

  Sara Flores, Daniel Fernández de los Reyes, Verónica Braza, Teresa Ben, Alejandro Gallego, Lazar Stanojević, Malte Schwarz, Jose Maria Ulloa, David Gonzalez

• Exploring the laser-induced Phase Changes in two-dimensional MoTe2 via Electron Microscopy and Spectroscopy Techniques

  Samad Abdus, Eoin Moynihan, Dr Alan Harvey, Prof Ursel Bangert

• Understanding mesoporous nitride semiconductors using electron microscopy

  Fabien Massabuau, Peter Griffin, Helen Springbett, Giorgio Divitini, Yingjun Liu, R. Vasant Kumar, Maruf Sarkar, Francesca Adams, Sidra Abbas, Saptarsi Ghosh, Jordan Penn, Chaowang Liu, Hasan Hirshy, Menno Kappers, Gunnar Kusch, Tongtong Zhu, Rachel Oliver

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