Gold Sponsor
Introducing the CRYO ARM™ cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography, and MicroED.
The JSM-IT800 employs a new easy to use GUI "SEM Center", that serves as a common platform that enables a full range of functionality from high-resolution observation to high-speed elemental mapping. This platform features a JEOL In-Lens Schottky Plus Field Emission Electron Gun, a next-generation electron optical control system "Neo Engine" and a fully embedded JEOL EDS system.
The NeoScope™ Benchtop SEM is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis", incorporating three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.
Visit us at our workshops:
Which SEM? - Tuesday 6 July, 1245 - 1315
Interface upgrades provide high level control over JEOL TEM operation - Wednesday 7 July, 1000 - 1030
With open ARMs – JEOL Corrected Microscopy solutions for widening your capabilities - Wednesday 7 July, 1215 - 1245
Keywords: Cryo CLEM, Cryo Electron Tomography, Cryo-EM, Electron Microscopy & Related Techniques, FIB SEM, General Microscopy, Material & Physical Sciences, Nano, Single Particle Analysis, X-Ray & Tomography