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  • The correlation between ptychographic phase and ADF intensity: A new approach for quantitative STEM
  • The correlation between ptychographic phase and ADF intensity: A new approach for quantitative STEM

    Abstract number
    20
    Presentation Form
    Poster Flash Talk + Poster
    Corresponding Email
    [email protected]
    Session
    Stream 2: EMAG - Automated Control, Advanced Data Processing
    Authors
    Dr Ali Mostaed (1), Prof Angus I. Kirkland (1, 2, 3), Prof Peter Nellist (1)
    Affiliations
    1. Department of Materials, University of Oxford
    2. electron Physical Science Imaging Centre (ePSIC), Diamond Light Source
    3. Rosalind Franklin Institute, Harwell Campus
    Keywords

    Ptychography, ADF, Quantitative STEM

    Abstract text

    The abstract content is not included at the request of the author.

    References

    [1] T. Seki, Y. Ikuhara, N. Shibata, Ultramicroscopy 193 (2018) 118–125.

    [2] L.J. Allen, A.J. D׳Alfonso, S.D. Findlay, Ultramicroscopy 151 (2015) 11–22.