FIB & EM Prep User Group Meeting

HOME MEETINGS FIB & EM Prep User Group Meeting

03 - 06 July 2017, Manchester, UK

Following the tremendous success of previous meetings, the 5th UK FIB & EM Prep User Group Meeting will take place at mmc2017 on Tuesday 4 July

The UK FIB & EM Prep User Group has been organized to provide an open forum for FIB users and all users of EM specimen preparation equipment to share technique advances, discuss best practices, present experimental and theoretical findings/discoveries, exchange tips for preparation of difficult materials and learn about new developments in both instrumentation and techniques, as well meet new colleagues and old friends.

This meeting is aimed at researchers, failure analysis engineers, PhD students, and anyone having a need to understand today’s FIB and EM sample preparation technologies. If you are interested in FIB or EM sample preparation techniques, please do join us at mmc2017.

This meeting will be taking place in Cobden rooms 3&4 of Manchester Central.


10:20 Dual beam FIB microscopy: Enabling multiscale correlative CT
Philip Withers (University of Manchester)

10:50 Plant Tissues: Protocol Optimization for Transmission Electron Microscopy
Sara Bonucci (Gulbenkian Institute, Portugal)

11:05 Evaluating focused ion beam patterning for nanowire growth using computer vision
Aleksander Mosberg (NTNU, Norway)

11:20 CryoFIB at Diamond Light Source
Corey Hecksel (Diamond)

11:35 Enabling direct observation of the microstructure of organic reaction mixtures by scanning electron microscopy
Alexey Kashin (N.D. Zelinsky Institute of Organic Chemistry, Russia)

11:45 Picosecond laser ablation for SEM, XRM and Atom Probe sample preparation
Dr Michael Hassel-Shearer (Gatan Inc.)

12:00 Lunch and Exhibition

14:00 Helium, Neon and Gallium Focussed-Ion-Beam Methods for Nanodevice Fabrication
Paul Warburton (UCL)

14:30 Bone, scallop, coral: unravelling the nanoscale secrets of biominerals using FIB and electron microscopy
Roland Kroger (University of York)

14:45 Extending developments in 2D microanalysis (EDS and EBSD) to 3D material characterisation
John Lindsey (University of Manchester/Oxford Instruments)

15:15 Advances in 3D imaging using the Crossbeam
William Harris (Carl Zeiss)

15:30 Automating S/TEM preparation for diverse sample types
Daniel Phifer (FEI)

15:45 Round Table Discussion

You can register to attend this free meeting when you register to attend mmc2017.


This meeting is generously sponsored by

Stay up to date

Subscribe to the RMS newsletter that will be packed with up to date information and notifications in the run-up to mmc2017. Details provided here will not be passed to third parties.

Once you have hit Submit you will receive a confirmation email.

Follow us

Share this page



Free Exhibition Visitor Registration Open

Posted by:

You can now register in advance to access all that the exhibition has to offer including free training opportunities

Read full post »


New Industry Meeting announced for mmc2017

Posted by:

The British Measurement and Testing Association will hold an Optical Inspection seminar at mmc2017

Read full post »


93% of exhibition space sold

Posted by:

Space for mmc2017 is nearly sold out and there are companies still enquiring. Act quickly if you plan to join us.

Read full post »

Previous events

mmc2017 is the latest in an impressive list of events dating back to the 1960s starting with the Micro conference and exhibition series. This later became MicroScience which grew ever-bigger until 2010. The RMS hosted the European Microscopy Congress in 2012 which was the catalyst for the current Microscience Microscopy Congress series.

Visit mmc2015 >>

Visit mmc2014 >>

Using the site

Privacy Policy

Terms & Conditions

Site Map

If you notice inaccuracies or omissions on the mmc2017 site, please report them to